High-resolution electron microscopy: from imaging toward measuring
نویسندگان
چکیده
High-resolution electron microscopy is discussed as a measuring, rather than an imaging, technique. It is shown that the interpretation of the images could greatly benefit from a quantitative instead of a qualitative approach accompanied by quantitative statistical experimental design.
منابع مشابه
High Resolution Electron Microscopy: From Imaging towards Measuring
High resolution electron microscopy is discussed as a measuring, rather than an imaging technique. It is shown that the interpretation of the images could greatly benefit from a quantitative instead of a qualitative approach accompanied by quantitative statistical experimental design.
متن کاملAtomic-Resolution Imaging and Analysis with Cs-Corrected Scanning Transmission Electron Microscopy
Advances in nanotechnology and electronic device miniaturization are making atomic-level control of structure and composition increasingly important. To promote research and development in this field, it is essential to develop technology for measuring the structures, compositions, and properties of materials and devices with atomic resolution. Scanning transmission electron microscopy (STEM), ...
متن کاملAccuracy of surface strain measurements from transmission electron microscopy images of nanoparticles
Strain analysis from high-resolution transmission electron microscopy (HRTEM) images offers a convenient tool for measuring strain in materials at the atomic scale. In this paper we present a theoretical study of the precision and accuracy of surface strain measurements directly from aberration-corrected HRTEM images. We examine the influence of defocus, crystal tilt and noise, and find that ab...
متن کاملHigh-resolution low-dose scanning transmission electron microscopy.
During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording...
متن کاملScanning Electron Microscopy with Polarization Analysis (sempa) and Its Applications
Scanning Electron Microscopy with Polarization Analysis (SEMPA) is a technique for directly imaging the magnetic microstructure of surfaces and thin films. SEMPA relies on the fact that secondary electrons emitted from a magnetic sample in a Scanning Electron Microscope (SEM) have a spin polarization which reflects the net spin density in the material. This spin density, in turn, is directly re...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- IEEE Trans. Instrumentation and Measurement
دوره 51 شماره
صفحات -
تاریخ انتشار 2002